Jeffery Wyss
(PD)
3/23/15, 2:00 PM
Carlo Civinini
(FI)
3/24/15, 9:00 AM
Mara Bruzzi
(FI)
3/24/15, 11:10 AM
Dr
Walter Snoeys Snoeys
(CERN)
3/24/15, 2:00 PM
giovanni margutti
(LFoundry srl)
3/24/15, 4:10 PM
giovanni margutti
(LFoundry srl)
3/24/15, 5:00 PM
Lodovico Ratti
(PV)
3/25/15, 11:10 AM
Prof.
Gang Guo
(China Institute for Atomic Energy)
3/25/15, 2:00 PM
Prof.
Silvio Manea
(INPE, Brasile)
3/25/15, 2:50 PM
Cesar Boatella Polo
(ESA ESTEC)
3/25/15, 4:10 PM
Mariolina Sarno
(Thales Alenia Space), Dr
Roberta Mancini
(Thales Alenia Spac, Italia)
3/25/15, 5:00 PM
Mr
D M S Sultan
(University of Trento)
3/26/15, 9:50 AM
Mr
RAFFAELLO SECONDO
(CERN)
3/26/15, 10:10 AM
Mr
Jiri Hofman
(Cobham RAD Solutions)
3/26/15, 10:30 AM
Mrs
Stephanie DHOMBRES
(Universite Montpellier/Systheia)
3/26/15, 11:20 AM
Mr
Carlo Giordano
(DIMES - UNICAL)
3/26/15, 11:40 AM
Mr
Boyang Du
(Politecnico di Torino)
3/26/15, 12:00 PM
Lili Ding
(PD)
3/26/15, 12:20 PM
Ms
Elisa Riceputi
(Università degli Studi di Bergamo)
3/26/15, 12:40 PM
Lorenzo Giuntini
(FI)
3/26/15, 3:00 PM
tullio grassi
(FNAL)
3/26/15, 4:10 PM
Ennio Monteil
(TO)
3/26/15, 4:30 PM
Serena Panati
(TO)
3/26/15, 4:50 PM
Dr
Giulia Marcello
(DIEE - Dipartimento di Ingegneria Elettrica ed Elettronica)
3/26/15, 5:10 PM
Mr
Francesco Cordella
(ENEA)
3/26/15, 5:30 PM
Dr
Marco Durante
(GSI, Germania)
3/27/15, 9:00 AM
Vincenzo Patera
(ROMA1)
3/27/15, 9:50 AM
Mr
Muhammad Sajid
(CIIT Islamabad), Prof.
Nikolay Chechenin
(SINP MSU Russia), Prof.
Torres Frank
(DEE UFMG Brazil)
Oral
This paper concentrates on SRAM cell response in LEO radiation environment. The SEU rates of 65nm, 45nm and 32nm bulk CMOS technology based Static RAM cells were evaluated. The impact of technology scaling on SEU rates, LET threshold and cross-section per bit/device were compared with SOI CMOS SRAM cells. Dose-Depth analysis has been performed for various orbital inclinations and shield...