Summer School - Nuclear Physics meets Electronic Technology

Contribution List

1. Welcome

17/06/2024, 13:30

2. Introduction to semiconductors. Doping and hyperdoping

Enrico Di Russo (Università di Padova)

17/06/2024, 16:00

4. Electrical activation of implanted dopants: Statistical mechanical aspects of defect recovery and Hall effect characterization.

Marco Pieruccini (stituto per la Microelettronica e i Microsistemi Area della Ricerca di Bologna), Virginia Boldrini (IMM-CNR Bologna)

18/06/2024, 09:30

5. Nuclear Physics for Semiconductors and Solar Cells.

Andrea Denker (Helmholtz-Zentrum Berlin für Materialien und Energie)

18/06/2024, 11:00

6. Hands-On: Simulation of Ion implantation with SRIM software.

Marica Canino (CNR Italy)

18/06/2024, 14:00

7. Overview of the radiation induced degradation of electronic devices.

Francesco Velardi (University of Casssino)

18/06/2024, 16:00

8. Capacitive techniques for the defect characterization of semiconductor devices.

Luigi Di Benedetto (University of Salerno)

19/06/2024, 09:30

9. Non-contact methods for the characterization of high energy particle irradiation induced defects in various semiconductors.

Prof. Heinz-Christoph Neitzert (Univ. of Salerno)

19/06/2024, 11:00

10. Hands-On: Optoelectronic characterization of the radiation damage in light emitting diodes,

Christoph Heinz Neizert (Univ. of Salerno)

19/06/2024, 14:00

11. Hands-On: DLTS spectrum Analysis.

Luigi Di Benedetto (University of Salerno)

19/06/2024, 16:00

17. Optical characterization of implantation defects: the case study of sulphur implanted silicon

Filippo Fabbri (NANO-CNR)

19/06/2024, 17:30

18. Characterization of materials with elastic scattering experiments using MeV protons and alpha particles beams

Valentino Rigato (Istituto Nazionale di Fisica Nucleare)

20/06/2024, 09:30

13. Hands-On: Identification of the composition and thickness of the surface layers of a Schottky diode using a 4He charged particle beam.

Raffaele Buompane (Istituto Nazionale di Fisica Nucleare)

20/06/2024, 11:00

16. Visit to the Enrico Fermi Research Center

20/06/2024, 15:00

14. Principles of PIXE and PIGE, advanced techniques and applications.

Massimo Chiari (Istituto Nazionale di Fisica Nucleare)

21/06/2024, 09:30

15. Measurements of Hydrogen concentrations with an 15N-beam - principle and applications.

Hans-Werner Becker (Ruhr-Universität Bochum)

21/06/2024, 11:00

12. Optical characterization of implantation defects: the case study of sulphur implanted silicon

Filippo Fabbri (NANO-CNR)

3. Rutherford backscattering analyis and the method of channeling. H and D induced Nuclear Reaction Analysis as a complimentary method.