Login

Summer School - Nuclear Physics meets Electronic Technology

Jun 17 – 21, 2024
INFN Sezione di Roma
Europe/Rome timezone

Contribution List

18 out of 18 displayed
Export to PDF
  1. 1. Welcome
    6/17/24, 1:30 PM
  2. 2. Introduction to semiconductors. Doping and hyperdoping
    Enrico Di Russo (Università di Padova)
    6/17/24, 4:00 PM
  3. 4. Electrical activation of implanted dopants: Statistical mechanical aspects of defect recovery and Hall effect characterization.
    Marco Pieruccini (stituto per la Microelettronica e i Microsistemi Area della Ricerca di Bologna), Virginia Boldrini (IMM-CNR Bologna)
    6/18/24, 9:30 AM
  4. 5. Nuclear Physics for Semiconductors and Solar Cells.
    Andrea Denker (Helmholtz-Zentrum Berlin für Materialien und Energie)
    6/18/24, 11:00 AM
  5. 6. Hands-On: Simulation of Ion implantation with SRIM software.
    Marica Canino (CNR Italy)
    6/18/24, 2:00 PM
  6. 7. Overview of the radiation induced degradation of electronic devices.
    Francesco Velardi (University of Casssino)
    6/18/24, 4:00 PM
  7. 8. Capacitive techniques for the defect characterization of semiconductor devices.
    Luigi Di Benedetto (University of Salerno)
    6/19/24, 9:30 AM
  8. 9. Non-contact methods for the characterization of high energy particle irradiation induced defects in various semiconductors.
    Prof. Heinz-Christoph Neitzert (Univ. of Salerno)
    6/19/24, 11:00 AM
  9. 10. Hands-On: Optoelectronic characterization of the radiation damage in light emitting diodes,
    Christoph Heinz Neizert (Univ. of Salerno)
    6/19/24, 2:00 PM
  10. 11. Hands-On: DLTS spectrum Analysis.
    Luigi Di Benedetto (University of Salerno)
    6/19/24, 4:00 PM
  11. 17. Optical characterization of implantation defects: the case study of sulphur implanted silicon
    Filippo Fabbri (NANO-CNR)
    6/19/24, 5:30 PM
  12. 18. Characterization of materials with elastic scattering experiments using MeV protons and alpha particles beams
    Valentino Rigato (Istituto Nazionale di Fisica Nucleare)
    6/20/24, 9:30 AM
  13. 13. Hands-On: Identification of the composition and thickness of the surface layers of a Schottky diode using a 4He charged particle beam.
    Raffaele Buompane (Istituto Nazionale di Fisica Nucleare)
    6/20/24, 11:00 AM
  14. 16. Visit to the Enrico Fermi Research Center
    6/20/24, 3:00 PM
  15. 14. Principles of PIXE and PIGE, advanced techniques and applications.
    Massimo Chiari (Istituto Nazionale di Fisica Nucleare)
    6/21/24, 9:30 AM
  16. 15. Measurements of Hydrogen concentrations with an 15N-beam - principle and applications.
    Hans-Werner Becker (Ruhr-Universität Bochum)
    6/21/24, 11:00 AM
  17. 12. Optical characterization of implantation defects: the case study of sulphur implanted silicon
    Filippo Fabbri (NANO-CNR)
  18. 3. Rutherford backscattering analyis and the method of channeling. H and D induced Nuclear Reaction Analysis as a complimentary method.