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Summer School - Nuclear Physics meets Electronic Technology

17–21 Jun 2024
INFN Sezione di Roma
Europe/Rome timezone

Contribution List

18 out of 18 displayed
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  1. 1. Welcome
    17/06/2024, 13:30
  2. 2. Introduction to semiconductors. Doping and hyperdoping
    Enrico Di Russo (Università di Padova)
    17/06/2024, 16:00
  3. 4. Electrical activation of implanted dopants: Statistical mechanical aspects of defect recovery and Hall effect characterization.
    Marco Pieruccini (stituto per la Microelettronica e i Microsistemi Area della Ricerca di Bologna), Virginia Boldrini (IMM-CNR Bologna)
    18/06/2024, 09:30
  4. 5. Nuclear Physics for Semiconductors and Solar Cells.
    Andrea Denker (Helmholtz-Zentrum Berlin für Materialien und Energie)
    18/06/2024, 11:00
  5. 6. Hands-On: Simulation of Ion implantation with SRIM software.
    Marica Canino (CNR Italy)
    18/06/2024, 14:00
  6. 7. Overview of the radiation induced degradation of electronic devices.
    Francesco Velardi (University of Casssino)
    18/06/2024, 16:00
  7. 8. Capacitive techniques for the defect characterization of semiconductor devices.
    Luigi Di Benedetto (University of Salerno)
    19/06/2024, 09:30
  8. 9. Non-contact methods for the characterization of high energy particle irradiation induced defects in various semiconductors.
    Prof. Heinz-Christoph Neitzert (Univ. of Salerno)
    19/06/2024, 11:00
  9. 10. Hands-On: Optoelectronic characterization of the radiation damage in light emitting diodes,
    Christoph Heinz Neizert (Univ. of Salerno)
    19/06/2024, 14:00
  10. 11. Hands-On: DLTS spectrum Analysis.
    Luigi Di Benedetto (University of Salerno)
    19/06/2024, 16:00
  11. 17. Optical characterization of implantation defects: the case study of sulphur implanted silicon
    Filippo Fabbri (NANO-CNR)
    19/06/2024, 17:30
  12. 18. Characterization of materials with elastic scattering experiments using MeV protons and alpha particles beams
    Valentino Rigato (Istituto Nazionale di Fisica Nucleare)
    20/06/2024, 09:30
  13. 13. Hands-On: Identification of the composition and thickness of the surface layers of a Schottky diode using a 4He charged particle beam.
    Raffaele Buompane (Istituto Nazionale di Fisica Nucleare)
    20/06/2024, 11:00
  14. 16. Visit to the Enrico Fermi Research Center
    20/06/2024, 15:00
  15. 14. Principles of PIXE and PIGE, advanced techniques and applications.
    Massimo Chiari (Istituto Nazionale di Fisica Nucleare)
    21/06/2024, 09:30
  16. 15. Measurements of Hydrogen concentrations with an 15N-beam - principle and applications.
    Hans-Werner Becker (Ruhr-Universität Bochum)
    21/06/2024, 11:00
  17. 12. Optical characterization of implantation defects: the case study of sulphur implanted silicon
    Filippo Fabbri (NANO-CNR)
  18. 3. Rutherford backscattering analyis and the method of channeling. H and D induced Nuclear Reaction Analysis as a complimentary method.