Speaker
Description
High radiation environments are present in many fields, such as fusion facilities, nuclear reactors, high-luminosity accelerators, space and defense sector. The employed materials, e.g. plasma facing materials, and devices, e.g. Commercial Off-The-Shelf (COTS) semiconductor components, need to withstand excessive stressful radiation levels. Quick and adequate qualification tests against radiation effects on the materials and components are thus required to guarantee the performances in an operational environment and quick production. A study of the radiation-induced damage and of its effect on materials and electronic devices used in harsh environment was carried out employing different types of radiation sources (including conventionally accelerated protons, laser-accelerated protons, 60 Co gamma radiation, neutrons, convention stress testing facilities) and different characterization methods.
In this talk we compare the results obtained by the study and show that in our conditions, laser-accelerated protons have the advantage of being much more efficient for stress testing materials and components than other methods.
