14th International Conference on Nuclear Microprobe Technology and Applications

The DEFEL pulsed beam facility at INFN-LABEC, Florence: from millimetric to micrometric spatial resolution

8 Jul 2014, 12:30

20m

Auditorium (Centro Culturale San Gaetano, Padova)

Oral Communication Session 2 - Nuclear Microprobe Technology 2

Speaker

Mariaelena Fedi (Istituto Nazionale di Fisica Nucleare (INFN), Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)

Description

The pulsed beamline DEFEL of the 3 MV Tandem accelerator at the INFN-LABEC laboratory in Florence has been significantly upgraded to complement the existing high temporal resolution with the newly implemented high spatial resolution. At DEFEL beam pulsing is achieved by quickly sweeping the beam through adjustable slits. The fast beam deflection is actuated by a double system of deflecting plates. Particle bunch duration shorter than 1 ns is now routinely obtained. The average number of particles per bunch can be adjusted from less than one to many hundreds. This multiplicity depends, in our system, on the intensity of the initial continuous beam, on the intensity of the deflecting field, on the deflector-to-slit distance and on the slit apertures. Spatial resolution of the order of 10 micrometers has been achieved by installing four new remotely-controlled x-y slits. Beam characteristics can now be precisely monitored by using our new CMOS sensor-based Beam Profile Monitor. System stability was tested with pulsed beams of different ion species (H, Li, C, O, Ti, Fe and I). The updated facility opens up the possibility to map the response of semiconductor detectors with high spatial and temporal resolution, over a wide range of generated charge and ionization profiles.