Speaker
Brian Nathaniel Jones
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
Description
The fully ambient pressure micron lateral resolution secondary ion mass spectrometry (MeV-SIMS [1]) device at the Surrey Ion Beam Centre has recently had its analytical capabilities assessed. A 2 MV tandem accelerator and magnetic quadrupole lenses are used to accelerate and focus heavy primary ion beams through a thin exit window to exploit the electronic sputtering phenomenon in air. By simultaneously exciting and measuring characteristic X-rays both molecular and elemental analysis can be performed. A presentation will be given of data acquired of a wide range of samples, which include polymers, organics, and fine aerosol particles collected on PTFE filters.
A presentation of research being undertaken at the INFN Facility, Florence, Italy, outlines how MeV-SIMS is being applied in the field of cultural heritage. Determining the ideal conditions for performing MeV-SIMS on the precious samples that are often studied in this field is of paramount importance. A sample damage minimization campaign will determine primary ion parameters that simultaneously maximize the intact molecular ion yield as well as the heavy ion particle induced X-ray emission production cross section values. This work will offer a better understanding of the sensitivity and useful lateral resolution of MeV-SIMS.
[1] B. N. Jones, J. Matsuo, Y. Nakata, H. Yamada, J. Watts, S. Hinder, V. Palitsin, R. Webb, Surface and Interface Analysis, Special Issue: Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVII, Volume 43, Issue 1-2, 2011, 249–252
Primary author
Brian Nathaniel Jones
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
Co-authors
Franco Lucarelli
(Università di Firenze, Dipartimento di Fisica e Astronomia and INFN, Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)
Dr
Geoff Grime
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
Dr
Giulia Calzolai
(Università di Firenze, Dipartimento di Fisica e Astronomia and INFN, Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)
Dr
Julien Demarche
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
Lorenzo Giuntini
(Università di Firenze, Dipartimento di Fisica e Astronomia and INFN, Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)
Dr
Massimo Chiari
(Università di Firenze, Dipartimento di Fisica e Astronomia and INFN, Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)
Prof.
Roger Webb
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
Silvia Calusi
(Università di Firenze, Dipartimento di Fisica e Astronomia and INFN, Sezione di Firenze, Sesto Fiorentino, Firenze, Italy)
Silvia Nava
(INFN – Sezione di Firenze, Firenze, Italy)
Dr
Vladimir Palitsin
(University of Surrey, Ion Beam Centre, Guildford, Surrey, UK)
