Speaker
Dr
Zdravko Siketic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Description
In 2012, ToF-SIMS setup is constructed and installed at the Heavy Ion Microbeam Facility at the Ruđer Bošković Institute in Zagreb. In this method, secondary molecular ions are extracted from the sample after impact of heavy MeV ions, using an acceleration potential difference between the sample surface and a grounded extractor (± 5 kV). Tip of the extractor is positioned perpendicular to the sample surface at a distance of several mm. Dedicated Multi-Stop Time to Digital Converter (TDC) pulse processing electronics have been developed based on the FPGA card, enabling microbeam-scanning control, incoming ion microbeam pulsing and molecular mapping.
Imaging of heavy molecules (>300 Da) with submicron resolution is possible due to the enhanced yield of intact secondary molecular ions desorbed by MeV ions. Considering that this technique is actually the first among all ion beam analysis techniques able to provide information about molecular content of the sample, application perspectives seem to be extremely wide. Initial measurements have shown excellent sensitivity which was demonstrated in the analyses of several organic molecules [1].
In this work further development concerning enhancement and application of the method will be shown. Heavy ion beams from both RBI tandem accelerators as well as different focusing arrangements have been tested. Also, dedicated system for charge normalization, based on the PiN diode, has been developed.
We applied MeV TOF-SIMS for the analysis of modern paint materials. Degradation (stability) of the paints under different aging conditions is studied. In addition, first measurements and application of the MeV TOF-SIMS technique on the investigation of diabetes disease will be shown.
This work is supported by the UKF project „Study of modern paint materials and their stability using MeV SIMS and other analytical techniques“, bilateral project between Austria and Croatia „Application of MeV SIMS for identification and characterization of ageing properties of synthetic painting materials used in contemporary art“ and Marie Curie Actions - Initial Training Networks (ITN) as an Integrating Activity Supporting Postgraduate Research with Internships in Industry and Training Excellence (SPRITE) under EC contract no. 317169.
[1] T. Tadić, I. B. Radović, Z. Siketić, D. D. Cosic, N. Skukan, M. Jakšić and J. Matsuo, Development of a TOF SIMS setup at the Zagreb Heavy Ion Microbeam Facility, accepted to NIMB
Primary author
Dr
Zdravko Siketic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Co-authors
Donny Domagoj Cosic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Dr
Dubravka Jembrih-Simbürger
(Institute of Science and Technology in Art, Academy of Fine Arts, A-1010 Vienna, Austria)
Dr
Iva Bogdanovic Radovic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Marta Anghelone
(Institute of Science and Technology in Art, Academy of Fine Arts, A-1010 Vienna, Austria)
Dr
Milko Jaksic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Dr
Mirko Hadzija
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Natko Skukan
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Nikola Markovic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Dr
Tonci Tadic
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
Valentin Stoytschew
(Ruder Boskovic Institute, Bijenicka 54, HR-10000 Zagreb, Croatia)
