Dr
Japan Atomic Energy Agency (JAEA), Japan
Author in the following contributions
- P92 - Investigation of Deep Levels in Silicon Carbide using Ion-Induced Charge Transient Spectroscopy
- Transmission diamond membrane detector and vacuum window for external microbeams
- Development of Diagnostic Method for Deep Levels in Semiconductors using Charge Induced by Heavy Ion Microbeams
- Radiation Hardness of n-type SiC Schottky Diodes