Jul 3 – 4, 2014
INFN Laboratori Nazionali di Legnaro
Europe/Rome timezone

Topics, Lecturers and Timetable

Main topics
  • Fundamentals of ion beam handling and focusing
  • From micro to nano ion focusing systems
  • Principles of collimated beams and applications
  • Principles and applications of full field ion microscopy
  • Advances of ion beam based micro-analytical techniques in material science, art and archeology
  • Ion beam micromachining
  • Deterministic single ion implantation
  • Radio-Biology
  • Bio-PIXE

Invited Lecturers

Roberto Cherubini - INFN LNL (Italy)
Collimated beams: single ion microbeam for radio-biology

Max Doebeli - ETH Zürich (Switzerland)
Formation of micro-beams by capillary collimation

Lorenzo Giuntini - University of Firenze and INFN LABEC (Italy)
Focused ion beams: ion microscopy from extracted beams

Geoffrey Grime – University of Surrey (United Kingdom)
Brian Jones - University of Surrey (UK) and INFN LABEC (ITaly)
Molecular Imaging using micro-MeV SIMS

Jan Meijer – University of Leipzig (Germany)
Production of NV centers for new application

Paolo Olivero - University of Torino (Italy)
Focused and collimated ion beams for the deep ion beam lithography of diamond

Primoz Pelicon -  Institute “Jožef Stefan”, Ljubljana (Slovenia)
Focused beams: applications of the PIXE techniques to biological problems (bio-PIXE)

Luca Silvestrin - University of Padova (Italy)
The Sirad IEEM: a survey tool for the characterization of radiation tolerance of ICs

Frank Watt - National University of Singapore (Singapore)
Practical sessions
Daniele Ceccato - University of Padova and INFN LNL (Italy)
Luca Silvestrin - University of Padova (Italy)