Joint Training Course on Ion Beam Microscopy

Topics, Lecturers and Timetable

Main topics

• Fundamentals of ion beam handling and focusing
• From micro to nano ion focusing systems
• Principles of collimated beams and applications
• Principles and applications of full field ion microscopy
• Advances of ion beam based micro-analytical techniques in material science, art and archeology
• Ion beam micromachining
• Deterministic single ion implantation
• Radio-Biology
• Bio-PIXE

THE TIMETABLE MAY BE DOWNLOADED HERE

Invited Lecturers

Roberto Cherubini - INFN LNL (Italy)
Collimated beams: single ion microbeam for radio-biology

Max Doebeli - ETH Zürich (Switzerland)
Formation of micro-beams by capillary collimation

Lorenzo Giuntini - University of Firenze and INFN LABEC (Italy)
Focused ion beams: ion microscopy from extracted beams

Geoffrey Grime – University of Surrey (United Kingdom)

• The beam optics of nuclear microbeams: how to model and design probe-forming lenses for MeV ions
• MeV ion microbeams: a historical overview

Brian Jones - University of Surrey (UK) and INFN LABEC (ITaly)
Molecular Imaging using micro-MeV SIMS

Jan Meijer – University of Leipzig (Germany)
Production of NV centers for new application

Paolo Olivero - University of Torino (Italy)
Focused and collimated ion beams for the deep ion beam lithography of diamond

Primoz Pelicon -  Institute “Jožef Stefan”, Ljubljana (Slovenia)
Focused beams: applications of the PIXE techniques to biological problems (bio-PIXE)

Luca Silvestrin - University of Padova (Italy)
The Sirad IEEM: a survey tool for the characterization of radiation tolerance of ICs

Frank Watt - National University of Singapore (Singapore)

• The use of MeV ion nanobeams for microscopy of whole biological cells
• Proton Beam Writing

Practical sessions
Daniele Ceccato - University of Padova and INFN LNL (Italy)
Luca Silvestrin - University of Padova (Italy)