National Institute of Standards and Technology
Author in the following contributions
- Development of a Wide-Range X-ray Emission Spectroscopy Measurement System with Transition Edge Sensors and Microwave Multiplexed Readout
- Waveform Analysis of a 240 pixel TES for X-rays and charged particles using a function of triggering neighboring pixels
- Cold readout technology development for the LCLS - II soft x-ray spectrometer
- Hyperspectral X-ray Imaging