22–26 Jul 2019
Milano
Europe/Rome timezone

Progress on optical photon calibration source for X-ray microcalorimeters

25 Jul 2019, 17:45
1h 15m
Piazza Città di Lombardia (Milano)

Piazza Città di Lombardia

Milano

Piazza Città di Lombardia, 1, 20124 Milano MI
Poster Detector readout, signal processing, and related technologies Poster session

Speaker

Dr Felix Jaeckel (University of Wisconsin - Madison)

Description

High-resolution X-ray microcalorimeters are challenging to characterize and calibrate at low energies because of the difficulty of obtaining narrow calibration lines approaching the detector resolution. Short pulses of optical light, e.g. generated by a 405 nm laser diode, can be used to provide combs of very narrow calibration lines for TES detectors as long as the detector can resolve the photon number. We have recently demonstrated this scheme for high resolution X-ray micro-calorimeter pixels for photon numbers up to about n=130, i.e. about 400 eV. However, we found that the valleys between integer photon numbers fill in with increasing photon number so that for energies above 0.4 keV the photon number could not be resolved.
Here we describe ongoing work to identify the mechanism causing the degradation and discuss the prospects of extending the technique to higher energies.

Student (Ph.D., M.Sc. or B.Sc.) N
Less than 5 years of experience since completion of Ph.D N

Primary authors

Dr Felix Jaeckel (University of Wisconsin - Madison) Conjeepuram Ambarish (University of Wisconsin-Madison) Mr Nicholas Christensen (University of Wisconsin - Madison) Mrs Lan Hu (University of Wisconsin - Madison) Mr Zachary Huemann (University of Wisconsin - Madison) Mr Shukai Liu (University of Wisconsin - Madison) Dr D. McCammon (University of Wisconsin) Ms Mari McPheron (University of Wisconsin - Madison) Kari Nelms (University of Wisconsin) Avirup Roy (University of Wisconsin-Madison) Dr Dallas Wulf (University of Wisconsin-Madison)

Co-authors

Dr Kelsey Morgan (NIST) Dr Daniel Schmidt (NIST) Daniel Swetz (NIST) Joel Ullom (NIST/University of Colorado) Dr Simon, R. Bandler (NASA-GSFC) Dr James, A. Chervenak Kazuhiro Sakai (NASA/GSFC)

Presentation materials