Speaker
Description
We have developed a new transition edge sensor (TES) material with transition temperature in the range 100-200mK. The new material is a solid solution of two superconducting components, MoxNb1-x, co-sputtered from two high-purity single-component targets (Mo and Nb) . The transition temperature, Tc, has a minimum (dTc/dx=0) at intermediate concentration of the components. We have optimized deposition parameters and composition to provide films with a sharp superconducting transition at ~150mK. We investigated structural features of the films and surface morphology using X-ray diffraction (XRD) and Scanning Electron Microscopy. The XRD measurements indicate that grown films are polycrystalline, with a preferred orientation along the (110) crystal direction, and a clear correlation between superconducting properties and film microstructure.
| Student (Ph.D., M.Sc. or B.Sc.) | N |
|---|---|
| Less than 5 years of experience since completion of Ph.D | N |
