Mr
SRON Netherlands Institute for Space Research
Author in the following contributions
- Characterization of a Ti/Au TES with Au/Bi absorber under AC and DC bias
- Progress in the optimal TES pixel design for the X-IFU Frequency Division Multiplexing read-out
- Excess Johnson noise in non-uniform TESs
- Characterization of high aspect ratio TiAu TES X-ray microcalorimeters array using the X-IFU Frequency Domain Multiplexing readout
