23–28 Sept 2018
Europe/Rome timezone

Monitoring of the Plasma Generated by a Gas-Puff Target Source Dedicated for SXR/EUV Microscopy

26 Sept 2018, 10:30
15m

Speaker

Dr Alfio TORRISI (Nuclear Physics Institute, AS CR)

Description

A 10-Hz repetition rate, Nd:YAG pulsed laser (λ=1064 nm, pulse energy of 700 mJ, pulse duration of 3 ns) was used to irradiate different double stream gas-puff targets (DSGPTs). The interaction gives rise to the formation of plasma and the emission of SXR/EUV radiation. The DSGPTs are produced by a 0.4 mm in diameter nozzle, which injects the working gas (N2, Ar or Xe) at different pressures, and by a concentric ring-shaped nozzle with diameter from 0.7 to 1.5 mm for the He injection, which is the outer gas. The SXR/EUV emission from the plasma was optimized at 90° with respect to the incident laser radiation and nozzle axis. Silicon carbide (SiC) and AXUV-HS1 Si detectors were employed to characterize the produced plasma. Some aspects, related to monitoring, stability, and characterization of the plasma source, important from a standpoint of modern compact SXR/EUV microscopy systems, such as the overall evaluation of the signal and pulse time duration, will be presented and discussed.

Primary author

Dr Alfio TORRISI (Nuclear Physics Institute, AS CR)

Co-authors

Prof. Henryk Fiedorowicz (Institute of Optoelectronics, Military University of Technology, Warsaw, Poland) Lorenzo Torrisi (LNS) Prof. Przemyslaw Wachulak (Institute of Optoelectronics, Military University of Technology, Warsaw, Poland)

Presentation materials