23–28 Sept 2018
Europe/Rome timezone

Monitoring of the Plasma Generated by a Gas-Puff Target Source Dedicated for SXR/EUV Microscopy

26 Sept 2018, 10:30
15m

Speaker

Dr Alfio TORRISI (Nuclear Physics Institute, AS CR)

Description

A 10-Hz repetition rate, Nd:YAG pulsed laser (λ=1064 nm, pulse energy of 700 mJ, pulse duration of 3 ns) was used to irradiate different double stream gas-puff targets (DSGPTs). The interaction gives rise to the formation of plasma and the emission of SXR/EUV radiation. The DSGPTs are produced by a 0.4 mm in diameter nozzle, which injects the working gas (N2, Ar or Xe) at different pressures, and by a concentric ring-shaped nozzle with diameter from 0.7 to 1.5 mm for the He injection, which is the outer gas. The SXR/EUV emission from the plasma was optimized at 90° with respect to the incident laser radiation and nozzle axis. Silicon carbide (SiC) and AXUV-HS1 Si detectors were employed to characterize the produced plasma. Some aspects, related to monitoring, stability, and characterization of the plasma source, important from a standpoint of modern compact SXR/EUV microscopy systems, such as the overall evaluation of the signal and pulse time duration, will be presented and discussed.

Author

Dr Alfio TORRISI (Nuclear Physics Institute, AS CR)

Co-authors

Prof. Henryk Fiedorowicz (Institute of Optoelectronics, Military University of Technology, Warsaw, Poland) Lorenzo Torrisi (LNS) Prof. Przemyslaw Wachulak (Institute of Optoelectronics, Military University of Technology, Warsaw, Poland)

Presentation materials