Evaluation of a pulse counting type SOI pixel using synchrotron radiation X-rays

Not scheduled
20m
Sestri Levante

Sestri Levante

Grand Hotel dei Castelli
contributed paper

Speaker

Dr Ryo Hashimoto (Institute of Materials Structure Science, KEK)

Description

Application of the Silicon-On-Insulator (SOI) technology [1] to a pixelated detector for imaging experiments using Synchrotron X-rays is expected as a good method for developing a fine pixelated detector because there is no mechanical bump bonding in the SOI device. The first beam test for a proto type chip of a pulse counting type SOI pixel, CPIXTEG3b, was performed in BL-14A at Photon Factory, KEK. CPIXTEG3b was designed under the Double-SOI technology [2] for defensing from the cross talk and increasing the radiation hardness. It has a 64 × 64-pixel array where the area size of each pixel is 50 μm × 50 μm. Sensitivity for X-rays respect to the incident position in a pixel was measured with the pencil beam having a diameter of 10 μm at 8 keV and 16 keV of X-ray energy. Because of its small size of a pixel, this data also contained the charge sharing effect. Hence this data could be used for a study of the point spread function. Response of the discriminator in the analogue circuit of the pixel was calibrated by the electric pulse and this result was checked about all pixels by use of the flat field beam. In this conference, we will introduce some results of this performance tests. References [1] Y. Arai et al., Nucl. Inst. and Meth. A 636 (2011) 531. [2] T. Miyoshi et al., Nucl. Inst. and Meth. A732 (2013) 530.

Primary author

Dr Ryo Hashimoto (Institute of Materials Structure Science, KEK)

Co-authors

Dr Noriyuki Igarashi (Institute of Materials Structure Science, KEK) Prof. Qun Ouyang (State Key Laboratory of Particle Detection and Electronics (Institute of High Energy Physics, CAS)) Prof. Reiji Kumai (Institute of Materials Structure Science, KEK) Mr Ryutaro Nishimura (School of High Energy Accelerator Science, SOKENDAI) Prof. Shunji Kishimoto (Institute of Materials Structure Science, KEK) Dr Toshinobu Miyoshi (Institute of Particle and Nuclear Studies, KEK) Dr Yang Zhou (State Key Laboratory of Particle Detection and Electronics (Institute of High Energy Physics, CAS)) Prof. Yasuo Arai (Institute of Particle and Nuclear Studies, KEK) Dr Yunpeng Lu (State Key Laboratory of Particle Detection and Electronics (Institute of High Energy Physics, CAS))

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