Speaker
Description
High-resolution temporal diagnostics are essential for the development and optimization of next-generation high-brightness accelerators. This talk presents recent advances in wakefield-based diagnostics which enable single-shot, femtosecond-resolved measurements of ultra-short electron bunches. These diagnostics, based on the time-dependent transverse kick induced by beam-driven wakefields in dielectric or corrugated structures, have been successfully demonstrated at X-ray free-electron lasers (XFELs) as compact, cost-effective tools for beam and photon diagnostics. We will highlight their current use at SwissFEL, design and implementation strategies, and discuss ongoing efforts to adapt and deploy them in plasma-based accelerators, where robustness, synchronization, and compactness are essential.
