Speaker
Joakim Laksman
(European XFEL)
Description
Angle resolved photo-electron spectrometers with micro-channel plate detectors and combined with fast digitizer electronics are versatile and powerful devices for providing both soft and hard X-ray non-invasive single shot photon diagnostics at MHz repetition rate X-ray free-electron lasers.
Hard X-ray beamlines imposes specific design challenges due to poor photo-ionization cross-section and very high photo-electron velocities.
Furthermore, recent advancements in machine learning enables resolution enhancement by training the photo-electron spectrometer together with an invasive high resolution spectrometer which generates a response function model.
Primary author
Joakim Laksman
(European XFEL)
