Speaker
Description
The research and development of a radiation-hard detector for gamma beam monitoring takes place in the scientific context of the LUXE (Laser Und XFEL Experiment) strong-field QED experiment at DESY. At LUXE an intense ($10^9\;\gamma/{\rm BX}$) high-energy ($\sim\;16{\rm GeV}$) inverse Compton beam is produced by the itneraction of an electron beam with an intense laser. Laser absolute intensity probed by the initial electron is an important parameter, whose characterization has a key role in the process reconstruction. Such information is encoded in the Compton's spatial transverse distribution.
There are several requirements that such a device has to cope: an high-resolution ($5\;{\rm \mu m}$) in gamma beam profile reconstruction; a wide dynamic range of beam intensities (from $10^4$ to $10^9$ photons/bunch) and it has to be able to withstand an radiation-hard environment (several MGy/year) with a limited degrading of performance. These conditions are met by a sapphire (${\rm Al_2O_3}$) microstrip (p=100um) detector of 2cmx2cm. This material has high radiation tolerance, very low-leakage current (i.e., making a practically noiseless detector) and can be manufactured in a variety of shapes and large size (e.g., in comparison with diamond detectors).
The talk focuses on the research and development of such sapphire microstrip detector, from its early prototypes to the final stages. Results from a long experimental campaign of test and characterization (CCE, radiation damage, resolution) of sapphire pad and microstrip detectors are presented, by using sources (alfa, x-ray) and an electron beam. The latter both in a low-intensity regime (up to 40ke/bunch) at (INFN LNF) and under high-intensity irradiation (CERN).
| Collaboration | LUXE |
|---|---|
| Role of Submitter | I am the presenter |
