26 May 2024 to 1 June 2024
La Biodola - Isola d'Elba (Italy)
Europe/Rome timezone

3D simulation and experimental exploration of implementing double-sided 3D trench electrode detector with 8-inch CMOS Process

28 May 2024, 15:31
3h 49m
Sala Elena

Sala Elena

Poster T3 - Solid State Detectors Solid State Detectors - Poster session

Speaker

Prof. Zheng Li (Ludong University)

Description

A double-sided 3D trench electrode detector (DS-3DTED) structure is proposed in this work to investigate manufacturing process implementation of 3D detectors for high energy physics, X-ray spectroscopy and X-ray cosmology applications. The device electrical characteristics are carried out with TCAD tool, including electric potential and electric field distribution, I-V, C-V, full depletion voltage, transient current and CCE with MIP incidence. In addition, a manufacture method to realize the DS-3DTED device is presented. Furthermore, a 311 μm deep and 10 μm wide trench has been achieved through Bosch process on the IMECAS 8-inch CMOS platform to verify the feasibility of the device structure. The maximum depth to width ratio is close to 105:1 when the trench width is 2 μm, which is a excellent foundation for the future 3D detectors manufacture with large fill factor and small dead zone.

Role of Submitter I am the presenter

Primary authors

Manwen Liu (Chinese Academy of Sciences - IMECAS) Dr Shuai Jiang (Beijing Smart-chip Microelectronics technology co., ltd.) Mr Wenzheng Cheng (Institute of Microelectronics, Chinese Academy of Sciences (IMECAS)) Prof. Zheng Li (Ludong University) Prof. Zhihua Li (Institute of Microelectronics, Chinese Academy of Sciences (IMECAS))

Presentation materials