During the first Frascati workshop on high precision X-ray measurements, Christopher Schlesiger introduced our work on modeling the reflection properties of HAPG for X-rays. These efforts were motivated by our activities for the development of X-ray tube based spectrometers for high resolution X-ray spectroscopy, namely X-ray emission spectroscopy (XES) and X-ray absorption spectroscopy (XAS). Simulations of the response of HAPG X-ray optics played an important role for design and optimization as well as for the understanding of peak shapes, resolution effects and other spectral artifacts.
In this presentation, we will give an overview on our current and latest activities in the field of XAS and XES. Also the fundamentals of von Hamos spectroscopy with HAPG will be recapped briefly.
An overview of applications in various research projects will be given. Following the intention of the workshop, newer developments and progress in instrumentation and methodology will be presented and discussed in detail. The talk will conclude with a short overview over related projects and activities.