Speaker
Mr
Thomas Oseroff
(Cornell University)
Description
A TE mode niobium sample host cavity was used to characterize the RF performance of large 5” diameter thin film samples at 4 GHz. Exciting results were obtained from industry partner Ultramet’s CVD Nb3Sn grown on a copper substrate. These results indicate that slight alterations to the deposition process and use of higher purity precursors could lead to high-performance Nb3Sn coatings on copper, which would be a breakthrough accomplishment. In addition, encouraging RF measurements for bi-layer ALD NbN-Nb and ALD multilayer NbN-AlN-Nb, obtained from industry partner Veeco-CNT, were obtained. These initial results demonstrate the potential of ALD and CVD for use in SRF cavities.
Primary author
Mr
Thomas Oseroff
(Cornell University)
Co-author
Prof.
Matthias Liepe
(Cornell University)
