Speaker
Alexander Dierlamm
(Karlsruhe Institute of Technology)
Description
Diodes made from three different wafer materials (FZ, N-rich FZ, O-rich FZ) have been irradiated with protons (5e13 to 5e15neq/cm²) and are being characterized (IV, CV, TCT).
Here we present the first results of these measurements.
Primary author
Alexander Dierlamm
(Karlsruhe Institute of Technology)
