3D/Active edge sensors with FBK

Tuesday 14 Oct 2014, 15:00 → 17:00 Europe/Rome

Virtual Room

link alla agenda in area ATLAS https://agenda.infn.it/conferenceDisplay.py?confId=8220

VIDYO: http://vidyoportal.cern.ch/flex.html?roomdirect.html&key=E5DdQXGW4v5l
PIN : 0000

15:00 → 15:10 Introduction

Speaker: Prof. Gian Franco Dalla Betta (University of Trento)

15:10 → 15:20 Epitaxial wafer procurement

Speaker: Marco Meschini (FI)

15:20 → 15:40 Status of batches (3D and new planar) and DRIE tests

Speaker: Dr Sabina Ronchin (FBK)

15:40 → 16:00 Discussion on back-side metal for planar batch

16:00 → 16:45 Discussion: plans for sensor usage

Tests, bump bonding, thinning, etc.

Slides Test_misure_automatiche.pptx

16:45 → 16:50 Next meeting

Speaker: Prof. Gian Franco Dalla Betta (University of Trento)