Oct 5 – 10, 2014
Capri-Naples, Italy
Europe/Rome timezone

Background X-Ray Scattering in Wavelength Dispersive Absorptiometry

Oct 7, 2014, 12:15 PM
15m

Speaker

Alexey Gogolev

Description

The detailed information about x-ray spectrum is of highly importance for the x-ray analysis, especially for a used standardless algorithm. This paper provides a comparison between simulation results and experimental studies of the background X-ray scattering performed for the dual wave x-ray absorptiometry where integral value of the background plays a dominant role. In this case, the scattering background radiation achieves values of the order of the useful signal that leads to undesirable increase in the load of detector [1]. This problem is suggested to solve by reducing the background radiation using wave dispersion scheme and high-speed counters [2]. Experiments were carried out using a scintillation counters based on silicon photomultipliers [3] allowed to achieve the counting rate over 107 of pulses per second, which is highly relevant in terms of increasing the intensity of modern light sources. The simulation results using Monte-Carlo techniques have been obtained using the Geant 4 [4]. References 1. Stein-Arild Tjugum X-ray based densitometer for multiphase flow measurement // Patent US 20120087467 A1, G01N23/223 pub.date 12.04.2012. 2. Gogolev A.S., Cherepennikov Yu.M., Rezaev R.O. Device for determining a component of a multiphase fluid stream // Patent application RU 2014122059, G01N23/06 pub.date 31.05.2014. 3. Silicon Photomultipliers // SensL. - Mode of access: http://sensl.com/products/silicon-photomultipliers/bseries/. 4. J. Allison "Geant4 developments and applications", IEEE Trans. Nucl. Sci., vol. 53, no. 1, pp.270 -278 2006.

Primary author

Co-authors

Mr Andrey Ogrebo (Tomsk Polytechnic University) Dr Artem Vukolov (Tomsk Polytechnic University) Dr Roman Rezaev (National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)) Dr Tat'yana Gogoleva (Tomsk Polytechnic University) Mr Yury Cherepennikov (Tomsk Polytechnic University)

Presentation materials