Speaker
Dr
Marcos Fernandez Garcia
(IFCA-Santander)
Description
Edge-TCT (where TCT stands for Transient Current Technique) is a new experimental method for segmented detectors where a focused laser beam is injected from the side of the device. Using a beam much smaller than the thickness of the device under study, the drift of the induced charge carriers can be studied as a function of the injection position. Intrinsic properties of the devices can be profiled along this coordinate, namely the charge collection efficiency and drift velocity. We show in this contribution a new method to extract the electric field from the measured drift velocity profiles. We have applied this method to microstrip detectors of both N and P-bulk type, produced by 3 different manufacturers: Micron, VTT-Helsinki and Hamamatsu.
Primary author
Dr
Marcos Fernandez Garcia
(IFCA-Santander)
Co-authors
Dr
Christian Gallrapp
(CERN)
Mr
Hannes Neugebauer
(CERN)
Dr
Ivan Vila Alvarez
(IFCA-CSIC)
Dr
Markus Gabrysch
(Uppsala University)
Dr
Michael Moll
(CERN)
