Jul 3 – 5, 2013
Sala Convegni della Cassa di Risparmio di Firenze
Europe/Rome timezone

Extraction of electric field of non-irradiated microstrip detectors using the edge-TCT technique

Jul 5, 2013, 3:50 PM
Sala Convegni della Cassa di Risparmio di Firenze

Sala Convegni della Cassa di Risparmio di Firenze

via Folco Portinari, 5 - Florence (ITALY)


Dr Marcos Fernandez Garcia (IFCA-Santander)


Edge-TCT (where TCT stands for Transient Current Technique) is a new experimental method for segmented detectors where a focused laser beam is injected from the side of the device. Using a beam much smaller than the thickness of the device under study, the drift of the induced charge carriers can be studied as a function of the injection position. Intrinsic properties of the devices can be profiled along this coordinate, namely the charge collection efficiency and drift velocity. We show in this contribution a new method to extract the electric field from the measured drift velocity profiles. We have applied this method to microstrip detectors of both N and P-bulk type, produced by 3 different manufacturers: Micron, VTT-Helsinki and Hamamatsu.

Primary author

Dr Marcos Fernandez Garcia (IFCA-Santander)


Dr Christian Gallrapp (CERN) Mr Hannes Neugebauer (CERN) Dr Ivan Vila Alvarez (IFCA-CSIC) Dr Markus Gabrysch (Uppsala University) Dr Michael Moll (CERN)

Presentation materials