Speaker
Dr
Nikolai Smirnov
(Yale University)
Description
The development of different detectors based on GEM technology both
for PID and tracking including detailed detector response simulation
will be discussed. Description of the GEM foil (Tech-Etch production)
selection and test procedure will be presented.
A new approach for low mass, single plane 2d- and 3d- readout for GEM
detectors and test results will be described.
Primary authors
Dr
Nikolai Smirnov
(Yale University)
Dr
Richard Majka
(Yale University)
