106 Congresso Nazionale SIF 2020

New methods for the analysis of complex materials at the atomic level: The Single Phototronic Probe applied to the study of phyllosilicates.

14 Sept 2020, 00:00

10m

Milano

Speaker

Gianluigi Zangari del Balzo

Presentation materials

CONGRESSO SIF2020_ZANGARI_MICHE_MANUSCRIPT

ZANGARI_MICHE.mp4