22–28 mag 2022
La Biodola - Isola d'Elba (Italy)
Europe/Rome fuso orario
submission of the proceedings for the PM2021 has been postponed to July 31, 2022

Characterization of irradiated passive CMOS sensors for tracking in HEP experiments

24 mag 2022, 08:30
3O 45m

Relatore

Franz Glessgen (ETH Zürich)

Descrizione

Both the current upgrades to accelerator-based HEP detectors (e.g. ATLAS, CMS) and also future projects (e.g. CEPC, FCC) feature large-area silicon-based tracking detectors. Using production lines of industrial CMOS foundries to fabricate silicon radiation detectors, both for pixels and for large-area strip sensors would be most beneficial in terms of availability, throughput and cost. In addition, the availability of multi-layer routing of signals will provide the freedom to optimize the sensor geometry and the performance, with biasing structures implemented in poly-silicon layers and MIM-capacitors allowing for AC coupling. First samples of pixel sensors coming from the LFoundry production line have already been tested and showed good performance up to irradiation levels of 10^16 neq.cm^-2 for their potential operations as sensors for the CMS inner tracker. This presentation will focus on the systematic characterization of pixel modules at high irradiation levels, up to 1.64 x 10^16 neq.cm^-2, studying the performance in terms of charge collection, position resolution and hit efficiency with measurements performed in the laboratory and with beam tests.

Collaboration CMS

Autore principale

Franz Glessgen (ETH Zürich)

Coautore

Prof. Florencia Canelli Arash Jofrehei Dr. Anna Macchiolo Dr. Malte Backhaus Weijie Jin Prof. Ben Kilminster Dr. Branislav Ristic Prof. Rainer Wallny Dr. Arne Reimers Armin Ilg

Materiali di presentazione