RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

Name: RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Start: 2009-09-30T08:45:00+02:00
End: 2009-10-02T19:00:00+02:00
Location: Sala Convegni della Cassa di Risparmio di Firenze

30 September 2009 to 2 October 2009

Sala Convegni della Cassa di Risparmio di Firenze

Europe/Rome timezone

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rd09@fi.infn.it

Determination of Si wafer resistivity distributions by C-V measurements

1 Oct 2009, 09:00

20m

Sala Convegni della Cassa di Risparmio di Firenze

Via Folco Portinari 5 - Firenze, Italy

Andrzej J. Kordyasz (Warsaw University)

Slides

Kordyasznew37.pdf

RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

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Determination of Si wafer resistivity distributions by C-V measurements

Sala Convegni della Cassa di Risparmio di Firenze

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RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

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Presentation materials