Speaker
Rene Glaser
(FSU Jena / IFK / TTP)
Description
The photoelastic coefficients p11-p12 and p44 of silicon for light of a wavelength of 1550 nm was measured using a rotating quarter wave plate polarimeter. The results p11-p12 = (-0.1139±0.0014) and p44 = (-0.0501±0.0014) for room temperature agree well with previously published data for various wavelengths. Additional measurements for the temperature dependence of the p11-p12 coefficients were done using a similar setup combined with a cryostat allowing sample temperatures down to about 10 K. The measurements show a temperature dependence with a maximum deviation of about 10% relative to the room temperature value.
Primary author
Rene Glaser
(FSU Jena / IFK / TTP)
Co-author
Dr
Ronny Nawrodt
(Friedrich-Schiller-University Jena)
