Infrared nano-spectroscopy with atomic force microscope probes

by Andrea Centrone (National Institute of Standard and Technology (NIST) - Gaithersburg, Maryland, USA)

Tuesday 7 Oct 2014, 14:30 → 15:00 Europe/Rome

Aula riunioni (Istituto Italiano di Tecnologia, Viale Regina Elena 291)

Photo Thermal Induced Resonance (PTIR) circumvents the limitations of light diffraction by employing an AFM tip as a local detector for measuring light absorption in the sample. Following the description of the PTIR working principles, this novel technique will be applied to characterize plasmonic resonators. In particular, the ability to provide near-field absorption spectra and images of plasmonic hot-spots and plasmonic modes will be extensively discussed and compared with other near-field techniques.