Introduction

• Gian Franco Dalla Betta (University of Trento)

Epitaxial wafer procurement

• Giovanni Darbo (GE)

Planar sensor layout

• Gabriele Giacomini (Fondazione Bruno Kessler FBK)
• Alberto Messineo (PI)

Status of 3D batch and DRIE tests

• Sabina Ronchin (FBK)
• Maurizio Boscardin

New pixel layouts compatible with FEI4 testing

• Gian-Franco Dalla Betta (TIFP)

Discussion

Next meeting

• Gian Franco Dalla Betta (University of Trento)