Relatore
Sig.
Yury Cherepennikov
(Tomsk Polytechnic University)
Descrizione
Nowadays X-ray absorptiometry is widely used in the X-ray structural analysis [1]. Moreover, this approach can be applied to elemental analysis of substance [2]. Another important applied task in which X-ray absorption approach is used is content control of components in media containing limited number of fractions, e.g. composition control of two- and three-component media that industry needs [3]. The authors have proposed the method of dual wave x-ray absorptiometry [4] which means absorption factors analysis in two X-ray spectral lines. Since the primary radiation, which penetrates an investigated object and weakens in a varying degree depending on component composition of the object, is information carrier, the main limiting factor for sensitivity of the method is registered X-ray beam intensity. Two approaches can be used to increase the intensity. The first one is concentrating X-ray optics such as multicapillary half-lenses. Besides, use of optics makes it possible to carry out analysis with lower current of the source and therefore extend its lifespan. The second approach is optimization of X-ray monochromatization scheme. In this report possibility of multicapillary optics use for increased initial X-ray beam intensity is reviewed and comparison of the one- and two-crystals monocromatization schemes is made.
References
1. Bunker G 2010 Introduction to XAFS: A Practical Guide to X-ray Absorption Fine Structure Spectroscopy (New York: Cambridge University Press)
2. A. Gogolev, Yu. Cherepennikov, Device for X-ray spectral absorption analysis with use of acoustic monochromator, Journal of Physics: Conference Series, V. 517, Article number 012037 (2014) 1-5
3. Stein-Arild Tjugum X-ray based densitometer for multiphase flow measurement // Patent US 20120087467 A1, G01N23/223 pub.date 12.04.2012.
4. A. S. Gogolev, R. O. Rezaev and Yu. M. Cherepennikov, Patent Application RU 2014122059 (2014)
Autore principale
Sig.
Yury Cherepennikov
(Tomsk Polytechnic University)
Coautore
Alexey Gogolev
Andrey Ogrebo
(Tomsk Polytechnic University)
Roman Rezaev
(National Research Nuclear University MEPhI (Moscow Engineering Physics Institute))
