Opened
1 Apr 2013
Closed
4 Jul 2014
We are glad to welcome registrations to RD13 - the 11th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors. The conference will be held from 3 to 5 July 2013 in Florece (ITALY). The conference venue is Sala dei Convegni della Cassa di Risparmio di Firenze, via Folco Portinari, 5. The registration fee is 300 euro and can be payed on arrival at the conference desk.
Registration is closed
The registration period has passed.