23–28 Sept 2012
Alghero, Sardegna, Italy
Europe/Rome timezone

Development of a Beam Profile Monitor Using Parametric X-ray Radiation

27 Sept 2012, 19:23
1m
Alghero, Sardegna, Italy

Alghero, Sardegna, Italy

Hotel Calabona
Poster Session PS2 Poster Sesion

Speaker

Dr Yuichi Takabayashi (SAGA Light Source)

Description

We propose two new methods (local and remote methods) of measuring electron beam profiles using parametric X-ray radiation (PXR). For the local method, we have demonstrated a proof-of-principle experiment, in good agreement with the results obtained with an ordinary method using a fluorescent screen. For the remote method, we have proposed to use Fresnel zone plates (FZPs) as X-ray lenses. As a first step, the experiments on PXR focusing using a single FZP are in progress at the SAGA Light Source. The proposed methods may be useful for recent advanced accelerators where the bunch length of the electron beam is too short or the beam size is too small.

Primary author

Dr Yuichi Takabayashi (SAGA Light Source)

Co-author

Dr Kazushi Sumitani (SAGA Light Source)

Presentation materials

There are no materials yet.