Speaker
Prof.
Aleksandr Potylitsyn
(Tomsk Polytechnic University)
Description
The interference pattern obtained by two diffraction radiation (DR) beams from two shifted targets may be used to determine the length of ultra-short electron bunches.Recently there was established the flexible coherent diffraction radiation interferometry scheme at the SINAP accelerator facility. Here we report the results of the first measurement of the electron bunch length down to sub-picosecond using such a technique.
The main parameters of fs linac were followings: beam energy – 21 MeV, macropulse repetition rate – 6.25 Hz, micropulse repetition frequency – 2856.2 MHz. This accelerator provides electron bunch length of 0.3 – 3 ps and normalized emittance ~10π mm×mrad.
The DR target was consisted of two plates (with sizes 46×20 mm2) made from 2 µm aluminum foil covered on 0.3 mm polyamide film. Both plates fixed on the holder with a possibility to move one plate relative other one along the beam direction with a step 16 µm. During such a movement we measured coherent DR intensity for each position (interferogram). We used a pyroelectric detector (the aperture diameter 5 mm, the sensitivity range 0.01 – 3 mm).
From the measured interferogram the rms bunch length was found to be about 660 femtosecond, which confirms the ability of the proposed technique for non-invasive bunch length measurements in the sub-picosecond range.
Primary authors
Mr
Dmitry Shkitov
(Tomsk Polytechnic University)
Mr
Jianbing Zhang
(Shanghai Institute of Applied Physics)
Co-authors
Prof.
Aleksandr Potylitsyn
(Tomsk Polytechnic University)
Dr
Gennady Naumenko
(Tomsk Polytechnic University)
Mr
Haixiao Deng
(Shanghai Institute of Applied Physics)
Mr
Kairong Ye
(Shanghai Institute of Applied Physics)
Mr
Mikhail Shevelev
(Tomsk Polytechnic University)
Mr
Shanliang Lu
(Shanghai Institute of Applied Physics)
Mr
Tiemin Yu
(Shanghai Institute of Applied Physics)
