Speaker
Dr
Sergey Uglov
(Tomsk Polytechnic University)
Description
In this work the energy dependences of the spots and bands in angular patterns of X-rays generated by 20-35 MeV rechanneling electrons in a 2 mm thick Si crystal are presented. It is shown that such a complicated “background” additional to ordinary bremsstrahlung must be taken into account at studying of X-ray generation in periodic structures created on crystalline substrates because in the some cases the X-rays from rechanneling electrons might be so intensive that could mask the effects defined by the periodic structures.
Primary author
Dr
Valery Kaplin
(Tomsk Polytechnic University)
Co-author
Dr
Sergey Uglov
(Tomsk Polytechnic University)
