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10:10
Single-mask X-ray multimodal imaging for the investigation of dynamic processes
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Lorenzo Massimi
(CNR-Nanotec (Rome Unit),National Research Council of Italy, Rome, Italy)
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10:40
Precision X-ray Measurements with Silicon Drift Detectors in the SIDDHARTA-2 Experiment
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Francesco Clozza
(Istituto Nazionale di Fisica Nucleare)
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11:00
Study of the excess noise and optimum operating conditions for LGAD detectors in high precision X-γ ray spectroscopy
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Iurii Eremeev
(Politecnico di Milano)
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11:20
Enhanced time resolution with a room-temperature energy dispersive X-ray PIN photodiode detector for improved EDX-EELS coincidence measurements in an electron microscope measurements
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Luca Serafini
(Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan)