14–18 Oct 2024
CEUB, Bertinoro
Europe/Rome timezone

Reflectivity measurements of VUV light at the scintillation wavelength of xenon on XENON1T/nT PTFE samples

16 Oct 2024, 16:45
45m
Sala Giovanni Andrea Caligari, Rocca Vescovile (CEUB, Bertinoro)

Sala Giovanni Andrea Caligari, Rocca Vescovile

CEUB, Bertinoro

CEUB Bertinoro Via Aldruda Frangipane, 6, 47032 Bertinoro FC The room "Sala Giovanni Andrea Caligari" is located at the entrance to the main floor of the Rocca

Speaker

Robert Braun

Description

Rare event searches as performed with liquid xenon (LXe) detectors demand a precise knowledge of the employed materials. Measurements of optical properties at the xenon scintillation wavelength in the VUV region are required for accurate simulations and detector characterization. Reflection measurements of polytetrafluorethylen (PTFE) were conducted in vacuum, gaseous and liquid xenon using the Reflectivity Setup in Münster. PTFE is the material used to encapsulate the active volume in the LXe detectors of the XENON dark matter project. This poster will report about the reflectivity of the PTFE from the XENON detectors depending on the surrounding material and its surface treatment.

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