1. General Seminars

Near field X-ray spectromicroscopies: new tools for nanoscience (Juris Purans - Ins. of Solid State Physics, Riga)

Auditorium B. Touschek (Laboratori Nazionali di Frascati)

Auditorium B. Touschek

Laboratori Nazionali di Frascati

Via Enrico Fermi 40 00044 Frascati

Near Field (NF) X-ray Spectromicroscopy (Far Field illumination and Near Field detection) is a fully new approach for the detailed investigation of nanostructures down to the nanometer level. In fact, the extremely high lateral resolution of Local Probe Microscopies (LPM) makes them among the most largely used in nanoscience. However, these tools suffer of a lack in chemical sensitivity. On the other hand, far field X-ray spectroscopy probes the chemical and structural properties of materials [2]. Therefore, a combination of X-rays spectroscopies and LPM is the ideal answer to many structural problems in nanosciences. This report highlights the most important contributions which were held in the combination of X-ray spectroscopies and LPM techniques. In this talk, I will present the state of the art and the new experimental results obtained with the XAS-SNOM prototype operating at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. I will illustrate the possibility to obtain an element-specific contrast and to perform nano-XAS experiments by detecting the Zn K and W L3 absorption edges in luminescent ZnO and ZnWO4 nanostructured thin films.

RB, 26/02/2008