106 Congresso Nazionale SIF 2020

Integration of circular intensity differential scattering scanning microscopy with two-photon fluorescence microscopy using a phasor plot approach for better resolution.

14 set 2020, 00:00

10m

Milano

Relatore

Ali Mohebi

Materiali di presentazione

Nanoscopy and Nikon Centre@IIT

SIF_congresso_106-presentation-A. Mohebi.mp4

SIF_congresso_106-presentation-A. Mohebi.pdf