National Institute of Standards and Technology
Author in the following contributions
- Development of a Wide-Range X-ray Emission Spectroscopy Measurement System with Transition Edge Sensors and Microwave Multiplexed Readout
- Response of transition edge sensors to charged particle impacts and analysis technique for exotic atom X-ray spectroscopy
- Waveform Analysis of a 240 pixel TES for X-rays and charged particles using a function of triggering neighboring pixels
- The end of unexplained noise? A New Model for Noise in TESs
- Advances in time-division SQUID multiplexing for TES X-ray-microcalorimeter arrays
- NSENSE: a nanoscale structure imaging tool based on X-ray tomography with a TES
- Cold readout technology development for the LCLS - II soft x-ray spectrometer
- Hyperspectral X-ray Imaging
