National Institute of Standards and Technology
Author in the following contributions
- Response of transition edge sensors to charged particle impacts and analysis technique for exotic atom X-ray spectroscopy
- Waveform Analysis of a 240 pixel TES for X-rays and charged particles using a function of triggering neighboring pixels
- Advances in time-division SQUID multiplexing for TES X-ray-microcalorimeter arrays
- NSENSE: a nanoscale structure imaging tool based on X-ray tomography with a TES
- Hyperspectral X-ray Imaging
