RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

Name: RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Start: 2009-09-30T08:45:00+02:00
End: 2009-10-02T19:00:00+02:00
Location: Sala Convegni della Cassa di Risparmio di Firenze

30 September 2009 to 2 October 2009

Sala Convegni della Cassa di Risparmio di Firenze

Europe/Rome timezone

Overview
Scientific Programme
Timetable
Contribution List
Author index

Support

rd09@fi.infn.it

Study of the Radiation-Hardness of VCSEL/PIN

2 Oct 2009, 16:15

20m

Sala Convegni della Cassa di Risparmio di Firenze

Via Folco Portinari 5 - Firenze, Italy

K. K. Gan (Ohio State University)

Slides

RD09_gan.pdf

RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

Support

Study of the Radiation-Hardness of VCSEL/PIN

Sala Convegni della Cassa di Risparmio di Firenze

Speaker

Presentation materials