RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

Name: RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors
Start: 2009-09-30T08:45:00+02:00
End: 2009-10-02T19:00:00+02:00
Location: Sala Convegni della Cassa di Risparmio di Firenze

September 30, 2009 to October 2, 2009

Sala Convegni della Cassa di Risparmio di Firenze

Europe/Rome timezone

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rd09@fi.infn.it

New Measurement of Lorentz angles for electrons and holes in silicon detectors

Oct 1, 2009, 11:50 AM

20m

Sala Convegni della Cassa di Risparmio di Firenze

Via Folco Portinari 5 - Firenze, Italy

Mike Schmanau (KIT)

Slides

Schmanau_CMS_Lorentz_angle_RD09.pdf

Schmanau_CMS_Lorentz_angle_RD09.ppt

RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

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New Measurement of Lorentz angles for electrons and holes in silicon detectors

Sala Convegni della Cassa di Risparmio di Firenze

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RD09 - 9th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors

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Presentation materials