Jan 25 – 27, 2017
INFN Laboratori Nazionali di Legnaro
Europe/Rome timezone

Characterization of the GET electronics for Si detector applications

Jan 27, 2017, 9:30 AM
Villi Meeting Room (INFN Laboratori Nazionali di Legnaro)

Villi Meeting Room

INFN Laboratori Nazionali di Legnaro

Viale dell'Università 2 - 35020 LEGNARO PD - Italy


Dr Alex Laffoley (GANIL)


Auxiliary detectors including Si and Si strip detectors placed inside the gas volume of the Active Target and Time Projection Chamber (ACTAR TPC) [1] represent an integral part of the overall detection system. Readout of the total number of 16384 channels from the highly segmented pad plane of ACTAR TPC will be performed using the electronics and data acquisition system recently developed by the General Electronics for TPCs (GET) collaboration [2]. To equip the additional ~512 channels of Si strip detectors the simplest solution was therefore to consider the use of these electronics for Si detector applications. In this talk, we will present a number of recent test results that were obtained to characterize the GET system for Si detectors including noise levels, gain, energy resolution, the GET internal trigger option and the overall system dead time. *The research leading to these results have received funding from the European Research Council under the European Union’s Seventh Framework Program (FP7/2007-2013)/ERC grant agreement no 335593. Research and development of the GET system was supported by the Agence Nationale de la Récherche (ANR) in France under contract no ANR-09-BLAN-0203-02 and the National Science Foundation (NSF) in the United States. REFERENCES [1] J.Pancin et al. Nucl. Instrum. Meth. Phys. Res. A 735, 532 (2014). [2] E.C.Pollacco et al. Phys. Procedia 37, 1799 (2012).

Primary author

Dr Alex Laffoley (GANIL)


Presentation materials