25-30 September 2016
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Hard X-rays with controlled parameters

Presented by Dr. Vahan KOCHARYAN on 29 Sep 2016 from 18:40 to 19:40
Type: Poster


In order to gain control over hard X-ray (over 30 keV), X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient has been considered. It has been experimentally proved that the intensity of the reflected beam can be increased up to several orders if the X-ray energies are 30 keV and 40 keV for reflecting atomic planes (10-11) depending on the value of the temperature gradient. It has been shown that with an increase in the temperature gradient the focus becomes closer to the crystal, the focal spot narrows in the diffraction plane and the integral intensity increases tenfold.

Primary authors

  • Vahan KOCHARYAN Institute of Applied Problems of Physics of NAS RA, 0014, Hr. Nersisyan str. 25, Yerevan, Armenia. National Research Tomsk Polytechnic University 634050, Lenin Avenue 30, Tomsk, Russia.