18th International Workshop on Low Temperature Detectors (LTD-18)

Details for Andre Kruth

Title: Mr

Affiliation: Central Institute of Engineering, Electronics and Analytics ZEA-2 – Electronic Systems,Forschungszentrum Jülich GmbH

Author in the following contributions

• Cryogenic instrumentation developed for the characterization of advanced CMOS technologies down to 250 mK
• Energy consumption, conversion, and transfer in nanometric Field-Effect-Transistors (FET) used in readout electronics at cryogenic temperatures