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SUMMARY:The characterization of metal photo-cathode for high brightness el
 ectron beam photoinjectors
DTSTART:20180717T123000Z
DTEND:20180717T130000Z
DTSTAMP:20261017T093700Z
UID:indico-event-15230@agenda.infn.it
DESCRIPTION:Speakers: Jessica Scifo (LNF)\n\nR&D activity on Cu photo-cath
 odes is under development at the SPARC_LAB test facility to fully characte
 rize each stage of the photocathode ‘‘life’’ and to have a complet
 e overview of the photoemission properties in high brightness photo-inject
 ors. The nano (n)-machining process presented here consists in diamond mil
 ling\, and blowing with dry nitrogen. This procedure reduces the roughness
  of the cathode surface and prevents surface contamination introduced by o
 ther techniques\, such as polishing with diamond paste or the machining wi
 th oil. Both high roughness and surface contamination cause an increase of
  intrinsic emittance and consequently a reduction of the overall electron 
 beam brightness. To quantify these effects\, we have characterized the pho
 tocathode surface in terms of roughness measurement\, and morphology and c
 hemical composition analysis by means of Scanning Electron Microscopy (SEM
 )\, Energy Dispersive Spectroscopy (EDS)\, and Atomic Force Microscopy (AF
 M) techniques. The effects of nmachining on the electron beam quality have
  been also investigated through emittance measurements before and after th
 e surface processing technique. Finally\, we present preliminary emittance
  studies of yttrium thin film on Cu photo-cathodes.\n\nhttps://agenda.infn
 .it/event/15230/
LOCATION:Meeting Room 126 (Accelerator Division\, Bldg. 2)
URL:https://agenda.infn.it/event/15230/
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